MLE4201



Advanced Materials Characterisation

Surface analyses: X-ray photoelectron spectroscopy; secondary ion mass spectroscopy; Auger electron spectroscopy. Low energy electron diffraction; Energy dispersive X-ray analysis and Rutherford back-scattering; Vibrational spectroscopies: infrared spectroscopy and Raman spectroscopy; Electronic spectroscopy: absorption and fluorescence; Magnetic and magneto-optical characterization: vibrating sample magnetometry, magneto-electronic measurement, magneto-optical Kerr-effect.

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